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Date: Thursday, February 8
Time: 1:15pm - 2:00pm
Pass Type: Conference (Paid) - Get your pass now!
Conference Track: Smart Manufacturing
Vault Recording: TBD
There is a growing need for inspecting micron level defects for consumer and medical devices. Unlike metrology, defects appear in non-prescribed locations. Both humans and machines find inspecting defects difficult, and this has severe repercussions in yield and quality. In addition to capturing several high-contrast defect pictures over large areas, software logic has to identify and classify defects. Meanwhile, hardware has to process the software logic and this adds complexity. Advancements in GPU processing have opened the doors for using deep learning algorithms to inspect these images. We will discuss ways that deep learning tools can be used for pre- and post-assembly inspection. This session will also explore deep learning applied to cosmetic defect detection and how that can reduce development time and costs.